BRUKER

Standnummer: 22

Bruker Nano Surfaces Division presents metrology systems:
• Atomic Force Microscopes
Nanoscale characterization of electrical, magnetic, compositional and material properties
• Optical Profilers
Non-contact 3D measurement of surface texture and roughness
• Stylus Profilers
Measure thin film roughness, step heights and stress

We offer unmatched metrology capabilities:
• Widest selection of metrology platforms and accessories, to fit every budget
• Only major AFM manufacturer with a world-class probes nanofabrication facility
• World leader in metrology innovation -- over 180 patents in AFM and surface profiling

For more information, please visit www.bruker-axs.com, email productinfo.europe@bruker-nano.com or contact your current sales representative.

 

Producten en diensten van BRUKER

• Measuring machines and measuring equipment

Contactgegevens

Bruynvisweg 18
1531 AZ WORMER
The Netherlands
Tel: +31 (0)88-1122700
Contactpersoon: Mr. Patrick Markus
productinfo.europe@bruker-nano.com
http://www.bruker-axs.com